Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer

An inspection company

TurboIn-Line Wafer Surface Defect Inspection
You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4" wafer with a 5 micron resolution
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Wafer GeometryProfiling the Wafer
For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution.
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Film ThicknessFor Copper Layer
To monitor your conductive film thickness, check out our 49-point probing ?
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Surface DefectUnpatterned Wafers

for transparent and exotic wafers, Alto offers a high speed defect inspection tool

Profilingfragile wafers

Measuring wafer thickness, TTV and other parameters are never this easy

Film Thickness Conductive Film

Thin & thick conductive film measurement in the range of 20Å – 60,000Å

Monitoring For SPC

From global view to local defect presentation, user-defined interface..